2021 IEEE International Conference of Optical Imaging and Measurement (IEEE ICOIM 2021)
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Dr. Guanhao Wu

Dr. Guanhao Wu

Presentation title:

Dual-comb distance measurement and its applications


Abstract: 

Absolute distance measurement is essential for high-accuracy manufacturing and assembling. Dual-comb ranging is an emerging tool that exploits phase resolution and frequency accuracy for precise and fast distance measurement. Using two coherent frequency combs, dual-comb ranging allows time and phase response to be measured rapidly. It breaks through the limitations related to the responsive bandwidth, ambiguity range, and dynamic measurement characteristics of conventional ranging tools. In this talk, I will introduce dual-comb ranging and summarizes the key techniques for realizing this ranging tool. Firstly, I will introduce TOF-based dual-comb ranging, including principles of system and parameter optimization, and then discuss the suppression of phase noise of the system. Finally, I will introduce the applications of dual-comb ranging system for the measurement of spaceborne camera and antenna.

 

Short Biography:

Guanhao Wu is currently an Associate Professor in the Department of Precision Instrument, Tsinghua University. He received Ph.D degree in optical engineering from Tsinghua University in 2008. He used to be a visiting scholar in National Metrology Institute of Japan (NMIJ) from 2011 to 2012. His research interests include frequency comb, comb-based distance measurement, light detection and ranging (Lidar) and other precise dimensional measurement technology. In recent years, he has published more than forty international refereed journal papers, and he is the holder of more than twenty Chinese patents. He won the Special Prize of Chinese Machinery Industry Science and Technology Award in 2020, and won the First Prize of Science and Technology Progress Award of Chinese Society for Measurement. Guanhao Wu has served on several technical committees for international and domestic conferences including the Conference on Lasers and Electro-Optics (CLEO). He is the member of the national optoelectronic measurement standardization technical committee, and the committee of metrology instrument professional board of China Institute of Measurement and Testing Technology.